JPH0476284U - - Google Patents

Info

Publication number
JPH0476284U
JPH0476284U JP12051790U JP12051790U JPH0476284U JP H0476284 U JPH0476284 U JP H0476284U JP 12051790 U JP12051790 U JP 12051790U JP 12051790 U JP12051790 U JP 12051790U JP H0476284 U JPH0476284 U JP H0476284U
Authority
JP
Japan
Prior art keywords
mold part
contact pin
position corresponding
outside
stepped part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12051790U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12051790U priority Critical patent/JPH0476284U/ja
Publication of JPH0476284U publication Critical patent/JPH0476284U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Connecting Device With Holders (AREA)
JP12051790U 1990-11-16 1990-11-16 Pending JPH0476284U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12051790U JPH0476284U (en]) 1990-11-16 1990-11-16

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12051790U JPH0476284U (en]) 1990-11-16 1990-11-16

Publications (1)

Publication Number Publication Date
JPH0476284U true JPH0476284U (en]) 1992-07-03

Family

ID=31868419

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12051790U Pending JPH0476284U (en]) 1990-11-16 1990-11-16

Country Status (1)

Country Link
JP (1) JPH0476284U (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007047011A (ja) * 2005-08-10 2007-02-22 Ngk Spark Plug Co Ltd 半導体素子検査用基板およびその製造方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007047011A (ja) * 2005-08-10 2007-02-22 Ngk Spark Plug Co Ltd 半導体素子検査用基板およびその製造方法

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